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cross-sectional field-emission scanning electron micrographs  (ThinFilms Inc)

 
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    ThinFilms Inc cross-sectional field-emission scanning electron micrographs
    Cross Sectional Field Emission Scanning Electron Micrographs, supplied by ThinFilms Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/cross-sectional+field-emission+scanning+electron+micrographs/cross+sectional+field+emission+scanning+electron+micrographs/pmc12056055__41467_2025_59597_MOESM1_ESM-32-44-15
    Average 90 stars, based on 1 article reviews
    cross-sectional field-emission scanning electron micrographs - by Bioz Stars, 2026-10
    90/100 stars

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    Article Title: Scalable and durable module-sized artificial leaf with a solar-to-hydrogen efficiency over 10%
    Article Snippet: S6 Fig. S4 | Effect of electron transport layers (ETLs) on the performance of Cl:FAPbI3 thinfilms. a, High-resolution cross-sectional field-emission scanning electron micrographs (FE-SEM) of n-i-p structured thin-film devices with functional layers including Au layer as top electrode, Spiro-OMeTAD as hole transporting layer (HTL), Cl:FAPbI3 as a photo-absorbing PSK layer and mesoporous titanium oxide (TiO2) as electron transport layer (ETL). b, Absorbance spectra of formamidinium lead triiodide (Cl:FAPbI3) thin-films using TiO2 (green color lines) and Cl:SnO2 (blue color lines) as ETLs with no significant change in absorption spectrum over the entire wavelength.



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